Fig. 1. Device design and characterization. (a) Microscope image (top left) of a patterned device. The scanning electron microscopy images of the coupling region (top right) and poling region (bottom). (b) The measured infrared spectrum for the racetrack microcavity. (c) Zoom-in spectra of infrared and visible TE 00 modes. (d) SHG spectrum by sweeping the pump laser from 1543 to 1548 nm. The insets in (b) and (d) are simulated mode profiles for 1545.6 nm and 772.8 nm, respectively.