View this email in your browser Spike-timing dependent plasticity (STDP) is a well established learning mechanism present in natural neural systems and also demonstrated in artificial synapses, including solid-state memristors.



STDP measurements can now be performed on the ArC ONE Memristor Characterisation Platform with ease. Read more about it here. STDP measurement module included in the ArC ONE Control software suite. Supports identical and dissimilar pre- and post- synaptic voltage spikes. Example STDP measurement with pre- and post- spikes as on left panel, taken on a TiOx memristive device. Features include: The waveform shapes of both the presynaptic and the postsynaptic spikes can be independently set by the user. This allows the possibility of experimenting with heterogeneous pre- and post- spike shapes .

. Easy visualisation of the net synaptic voltage waveform as a function of the time difference between pre- and post- spikes.

of the net synaptic voltage waveform as a function of the time difference between pre- and post- spikes. On the fly scaling in amplitude and duration of loaded voltage spikes.

of loaded voltage spikes. Apply multiple STDP pairs with controlled delay between pairs at the click of a button.

between pairs at the click of a button. Carry out STDP tests on single devices or square arrays of devices (up to 32x32). Get in Touch! ArC Instruments Ltd. delivers high performance testing platforms for characterising ‘en masse’ novel memory technologies in a fast and automated fashion. The company was born out of the necessity to efficiently close the loop between characterisation and development of emerging memory technologies, like Resistive Random Access Memory (RRAM). We have taken a user-centric approach in addressing this niche by developing high-precision testing instruments and intuitive software that are easy to operate. Find out more here.