

Caterpillar 30x Magnification (5mm width) | Photograph by OLIVER MECKES

Electron microscopes help bring nanoscience to life, providing a level of detail to scientists that was simply not available mere decades ago. The FEI Company is a worldwide leader in electron microscope technology. Below you will find a small collection of images from scientists around the world using FEI technology. Be sure to check out their extensive Flickr page with nearly 600 images and growing!

FEI ON FLICKR

2. Micro-crack in Steel by Martina Dienstleder



Photograph by MARTINA DIENSTLEDER / FEI

Microcrack after bending test

Coloured by Manuel Paller

Captured by Martina Dienstleder

Instrument used: Nova DualBeam Family

Horizontal Field Width: 67µm

Voltage: 5kV

Working Distance: 6.0

Detector: ETD – SE

3. Spider’s Head by Oliver Meckes



Photograph by OLIVER MECKES / FEI

Spiders Head

Captured by Oliver Meckes

Instrument used: Quanta Family

Magnification: 50x

Vacuum: Low Vac.

Voltage: 7 kV

Spot: 3

Working Distance: app.12mm

Detector: LFD + BSE

4. Nano Mirrors on DLP Television by Regino Sandoval



Photograph by REGINO SANDOVAL / FEI

DLP Nano Mirrors

Captured by Regino Sandoval

Instrument used: Nova DualBeam Family

Magnification: 3500x

Horizontal Field Width: 73.1um

Voltage: 10kV

Spot: 5

Working Distance: 5mm

Detector: SE

5. Birth of Ladybugs by Riccardo Antonelli



Photograph by RICCARDO ANTONELLI / FEI

Birth of ladybugs

Captured by Riccardo Antonelli

Instrument used: Quanta Family

Magnification: 40x

Horizontal Field Width: 3.54 mm

Vacuum: 0.974 torr

Voltage: 10.00 kV

Spot: 5.0

Working Distance: 10.00 mm

Detector: LFD (Low vacuum)

ELECTRON MICROSCOPY

On December 29th, 1959, the noted physicist Richard Feynman issued an invitation to scientists to enter a new field of discovery with his lecture entitled “There’s Plenty of Room at the Bottom,” delivered at the annual meeting of the American Physical Society at the California Institute of Technology (Caltech). Many would credit this talk as the genesis of the modern field of nanotechnology.

Since that time there has been extraordinary progress made over that period in the field of electron microscopy, one of

the primary tools of nanoscience. Feynman called explicitly for an electron microscope 100 times more powerful than those of his day, which could only resolve features as small as about one nanometer. While we have not achieved the 100x goal – the best resolution achieved to date is 0.05 nm, a 20x improvement – FEI has indeed met his challenge to create a microscope powerful enough to see individual atoms.

For an extensive introductory overview of electron microscopy, please refer to this document.

6. Parasitic Mite on Mosquito Larva by Nicole Ottawa



Photograph by NICOLE OTTAWA / FEI

Parasitic Mite on Mosquito Larva

Captured by Nicole Ottawa

Instrument used: Quanta Family

Magnification: 200

Horizontal Field Width: app. 500 µm

Vacuum: High-Vac

Voltage: 7kv

Spot: 3

Working Distance: 9,8

Detector: LFD, BSE

7. Hydrothermal Worm by Philippe Crassous



Photograph by PHILIPPE CRASSOUS / FEI

Hydrothermal worm

Captured by Philippe Crassous

Instrument used: Quanta Family

Magnification: 57

Horizontal Field Width: 5.26 mm

Vacuum: 10-4 mbar

Voltage: 5.0

Spot: 5.0

Working Distance: 12mm

Detector: SE

8. Dehydrated Breast Cancer Cell by Wadah Mahmoud



Photograph by WADAH MAHMOUD / FEI

Breast cancer cell, fixed and dehydrated

Captured by Wadah Mahmoud

Instrument used: Inspect Family

Magnification: 5,000

Voltage: 2 kV

Spot: 2.5

Working Distance: 12.4

Detector: SE

9. Water Mite by Nicole Ottawa



Photograph by NICOLE OTTAWA / FEI

Water Mite

Captured by Nicole Ottawa

Instrument used: Quanta Family

Magnification: 700x

Horizontal Field Width: 183µm

Vacuum: 40 Pa

Voltage: 7 kV

Spot: 3

Working Distance: app. 10mm

Detector: SE+BSE

10. Corrosion on Copper Bond Pad



Photograph via FEI COMPANY

THE FEI COMPANY – ABOUT



FEI Company is the world leader in the production and distribution of electron microscopes, including scanning electron microscopes (SEM), transmission electron microscopes (TEM), DualBeam™­ instruments, and focused ion beam tools (FIB), for nanoscale research, serving a broad range of customers worldwide. Nanotechnology is the science of finding, characterizing, analyzing and fabri­cating materials smaller than 100 nano­meters (a nanometer is one billionth of a meter). FEI’s global customer base includes researchers, scientists, engineers, lab managers, and other skilled professionals.

FEI manufactures complete microscope solutions that serve the following four segments:

Research: includes a broad range of institutes, universities, and national laboratories conducting nanoscale research for a wide variety of applications including 3D nano-characterization, in situ nanoprocesses, and 3D nanoprototyping.

Natural Resources: serving the micro-analysis needs of natural resources companies focused on mining, oil & gas exploration, and geosciences. Also provides solutions for forensics including gunshot residue analysis (GSR) and forensic science. (link will redirect to our Natural Resources micro-site, fei-natural-resources.com).

Electronics: developers and manufacturers in the semiconductor, data storage and related fields with an application focus in circuit edit, 3D metrology, defect analysis, failure analysis and TEM sample preparation.

Life Sciences: includes insti­tutes, universities, pharmaceutical companies and hospitals working in life sciences research and development in the areas of structural biology, cellular biology, tissue biology, and biomaterials.

FEI’s market-leading instruments include the latest in ion-­ and electron­-beam technologies. From the most power­ful, commercially-­available microscope­, the Titan™ 60-300 S/TEM, to the Magellan™, the first extreme high-resolution (XHR) scanning electron microscope, FEI produces cutting-edge tools that are revolutionizing nanoscale exploration from the classroom to the laboratory to the clean room. With a global commitment to customers before and after the sale, FEI is bringing the nanoscale within the grasp of leading researchers and manufacturers, and helping them turn some of the biggest ideas of this century into reality. FEI maintains research and develop­ment centers in North America, Europe, and Asia, and sales and service operations in more than 50 countries around the world. [Source]

11. Mosquito Larva and Parasite by Nicole Ottawa



Photograph by NICOLE OTTAWA / FEI

Mosquito Larva and Parasite

Captured by Nicole Ottawa

Instrument used: Quanta Family

Magnification: 60

Horizontal Field Width: 2000 µm

Vacuum: High-Vac

Voltage: 7kv

Spot: 3

Working Distance: 10,3

Detector: LFD, BSE

12. Iron Oxide by Francisco Rangel



Photograph by FRANCISCO RANGEL / FEI

Iron oxide

Captured by FRANCISCO RANGEL

Instrument used: Quanta Family

Magnification: 3963X

Horizontal Field Width: 75,3 ?m

Vacuum: 9.27e-7 mbar

Voltage: 20 kV

Spot: 2.0

Working Distance: 10.8

Detector: Mix: SE + BSE

13. Worm Polychaete by Philippe Crassous



Photograph by PHILIPPE CRASSOUS / FEI

Worm polychaete

Captured by Philippe Crassous

Instrument used: Quanta Family

Magnification: 150

Horizontal Field Width: 1.99mm

Vacuum: 10-4mbar

Voltage: 5

Spot: 4

Working Distance: 11.4

Detector: SE

14. Fly by Ivan Jimenez Boone



Photograph by IVAN JIMENEZ BOONE / FEI

Dirty fly

Captured by Ivan Jimenez Boone

Instrument used: MLA

Magnification: 100x

Voltage: 15kV

Spot: 7.2

Working Distance: 9.6

Detector: SE

15. Sugar Crystal by David McCarthy



Photograph by DAVID MCCARTHY / FEI

Sugar Crystal

Captured by David McCarthy

Instrument used: Quanta Family

Magnification: 187x

Horizontal Field Width: 1.37mm

Vacuum: 1.42e-4 Pas

Voltage: 0.5KV

Spot: 3.0

Working Distance: 8.5mm

Detector: SE

VISIT FEI.com FOR MORE INFORMATION

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